Spectral Speckle Analysis A New Method To Measure

A new method to measure coherence and dephasing in semiconductor nanostructures article in proceedings of spie the international society for optical engineering.

Spectral speckle analysis a new method to measure. A new method to measure the spontaneous polarization density ps of ferroelectric liquid crystals as a function of the temperature is described. Pdf a novel technique to investigate the properties of secondary emission of inhomogeneously broadened optical resonances in semiconductor materials. A new method to measure the coherence of inhomogeneously broadened optical excitations in semiconductor nanostructures is presented. Find read and cite all the research you.

Laser speckle imaging lsi is a versatile method to quantify and visualize the internal dynamics in complex and opaque materials. It is particularly adapted to measure small values of ps in regions where different nonlinear process compete. Such reflections may occur on materials such as paper. A speckle pattern is produced by the mutual interference of a set of coherent wavefronts.

The secondary emission of excitons in semiconductor quantum wells is investigated. It is based on the spectral decomposition of the polarization and measurement of the different temporal harmonics using a lock in amplifier. Initially devised as a medical imaging technique to map blood flow. They have been used in a variety of applications in microscopy imaging and optical manipulation.

Speckle patterns typically occur in diffuse reflections of monochromatic light such as laser light. The spectrally resolved coherence degree of resonantly excited light emission is deduced from the intensity fluctuations over the emission directions speckles. Although this phenomenon has been investigated by scientists since the time of newton speckles have come into prominence since the invention of the laser. The spectral correlations of the speckles give direct access to the homogeneous line width as function of spectral.

A new method to measure the spontaneous polarization density p s of ferroelectric liquid crystals as a function of the temperature is described. A new method to measure coherence and dephasing in semiconductor nanostructures nasaads a new method to measure the coherence of inhomogeneously broadened optical excitations in semiconductor nanostructures is presented. The secondary emission of excitons in semiconductor quantum wells is investigated. Usp schools escola de artes ciencias e humanidades each escola de comunicacoes e artes eca escola de enfermagem ee escola de enfermagem de ribeirao preto eerp escola de educacao fisica e esporte eefe escola de educacao fisica e esporte de ribeirao preto eeferp escola de engenharia de lorena eel escola de engenharia de sao carlos eesc escola politecnica ep escola.